Part Number : 5999965 | NSN : 6625-00-222-11176625002221117 |
Item Name : Test Set Semiconduc | Manufacturer : Joint Electronics Type Designation |
CAGE Code : 80058 | NIIN : 002221117 |
MRC | Criteria | Characteristic |
---|---|---|
ZZZV | Fsc Application Data | TEST SET,ELECT. EQUIP. |
ANNQ | Material And Location | ALUMINUM HOUSING |
MRC | Decoded Requirement | Clear Text Reply |
HGTH | Height | 3.880 INCHES NOMINAL |
AKWA | Joint Electronics Type Designation System Item Name | TEST SET,SEMICONDUCTOR DEVICE |
AKWB | Joint Electronics Type Designation System Item Type Number | TS-3253/TPM-39 |
ANPZ | Inclosure Feature | SINGLE ITEM W/HOUSING |
ABGL | Width | 4.250 INCHES NOMINAL |
AQXY | Test Type For Which Designed | MICROWAVE DIODE CURRENT |
SFTT | Surface Treatment | ENAMEL |
AQXZ | Operating Test Capability | MICROAMPHERE METER RANGE 0-1000 UA DC |
ABRY | Length | 5.500 INCHES NOMINAL |
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